Presenter: Frank Schreiber, Institut fuer Angewandte Physik, Universitaet Tuebingen, 72076 Tuebingen, Germany
Topic: X-Ray Scattering from Thin Films and Surfaces: Fundamentals and Practical Applications
Time: 10:00 AM, Sept. 29th
Location: Conference Room B, BLDG 909-1F
Abstract:
X-ray scattering is the traditionally the most successful method for structure determination, from inorganic materials to molecular systems to proteins.The conventional application is frequently considered to be associated with bulk materials, but of course there are many ways X-ray scattering can be employed to characterize thin films and surfaces or other forms of nano-materials. The presentation will explain the fundamentals of X-ray scattering from thin films and surfaces. After explaining the concept of grazing-incidence scattering and the associated surface-sensitivity we will discuss different specific applications, namely:
- X-ray reflectivity (XRR)
- grazing-incidence X-ray diffraction (GIXD)
- grazing-incidence small-angle X-ray scattering (GISAXS)
- nano-diffraction from nano-particles
For each technique, we will discuss practical applications to thin films, surfaces, and other nano-materials.
Biography:
1987 – 1992 undergraduate studies in physics at Bochum University
1992 Diploma (with distinction)
1995 Dr. rer. nat. (with distinction) at Bochum University
1995/1996 Research in Paris and Prague
1996-1997 Post-Doctoral Fellow at Princeton University
1998-2002 Research Assistant in Stuttgart (University and MPI-MF)
2002 Habilitation in Stuttgart
2002 - 2004 University Lecturer at the University of Oxford and Fellow of Wadham College
since December 2004 Professor (Chair) at Tübingen University
Contact：Prof. Steffen Duhm
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