题目: | Probing into Reverse Bias Dark Current in Perovskite Photodiodes: Critical Role of Surface Defects |
作者: | Zhao-Yang Yin1, Yang Chen1, Yang-Yang Zhang1, Yu Yuan1, Qian Yang1, Ya-Nan Zhong1, Xu Gao1, Jing Xiao2, Zhao-Kui Wang1, Jian-Long Xu1*, and Sui-Dong Wang1,3* |
单位: | 1Institute of Functional Nano & Soft Materials (FUNSOM) Jiangsu Key Laboratory for Carbon-Based Functional Materials & Devices Soochow University, Suzhou Jiangsu 215123, P. R. China. 2College of Physics and Electronic Engineering, Taishan University, Taian Shandong 271000, P. R. China. 3Macao Institute of Materials Science and Engineering (MIMSE), MUST-SUDA Joint Research Center for Advanced Functional Materials, Macau University of Science and Technology, Taipa Macao 999078, P. R. China. |
摘要: | |
影响因子: | 19.924 |
分区情况: | 一区 |
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责任编辑:郭佳